Microscopy

Brand / Model : Hitachi / S-4800

Field Emission Scanning Electron Microscope (FE-SEM)

Application : To examine the objects at high magnification and yield various information ie. topography, morphology
Analysis Range : x30 – x800,000
Description : Platinum coating, EDX
Type of sample : Solid

   Mr. Sutee Kaewsangiem

   02-2184126

    Sutee.K@chula.ac.th

Polarizing Optical Microscope (POM)

Application : To study the optical and chemical properties of samples, especially minerals under polarized light
Analysis Range : 40-200x
Description : Magnification rang 40-200x
Type of sample : Any type

   Mr. Sutee Kaewsangiem

   02-2184126

    Sutee.K@chula.ac.th

Brand / Model : Leica / DMRXP

Brand / Model : PARK SYSTEMS / XE-100

Atomic Force Microscope (AFM)

Application : To image and manipulate atoms and structures on a variety of surfaces (higher resolution than SEM)
Analysis Range : Scan Size 0.1-80 um
Description : Contact Mode, Non-contact Mode
Type of sample : Solid

   Mr. Sutee Kaewsangiem

   02-2184126

    Sutee.K@chula.ac.th

Transmission Electron Microscope (TEM)

Application : See objects to the order of a few angstrom (10-10 m). For example, you can study small details in the cell or different materials down to near atomic levels
Analysis Range : x30 – x800,000
Description : –
Type of sample : Solid

   

   

    

Brand / Model : Hitachi / S-4800