Spectroscopy

Brand / Model : Varian / SpectrAA 300 , GBC / Avanta PM

Atomic Absorption Spectrometer (AAS)

Application : To identify and measure trace single element in samples (ppm or % w/w)
Analysis Range : –
Description : –
Type of sample : Solid, Liquid

   Ms. Juthamas Thongliamskun

   02-2181840

   Juthamas.Th@chula.ac.th

Inductively Coupled Plasma Spectrometer (ICP)

Application : To identify and measure trace multi-elements in samples (ppm or % w/w)
Analysis Range : –
Description : –
Type of sample : solid, liquid

   Ms. Juthamas Thongliamskun

   02-2181840

   Juthamas.Th@chula.ac.th

Brand / Model : Perkin Elmer / Optima 4300DV

Brand / Model : Shimadzu / UV 2550

UV-VISIBLE Spectrophotometer (UV-VIS)

Application : To determine qualities and quantities of solid samples
Analysis Range : Wevelength 300-800 nm.
Description : –
Type of sample : Solid

   Ms. Juthamas Thongliamskun

   02-2181840

   Juthamas.Th@chula.ac.th

UV-VISIBLE Spectrophotometer (UV-VIS)

Application : To determine qualities and quantities of liquid samples
Analysis Range : Wevelength 200-800 nm.
Description : –
Type of sample : Liquid

   Ms. Juthamas Thongliamskun

   02-2181840

   Juthamas.Th@chula.ac.th

Brand / Model : Shimadzu / UV 1800

Brand / Model : Thermo Scientific / Nicolet Nexus iS5

Fourier Transform Infrared Spectroscopy (FTIR)

Application : To characterize functional groups of organic and inorganic compounds
Analysis Range : Wavenumber 650-4000
Description : Powder or Transparent sample, Opacity sample or liquid sample
Type of sample : Solid, Liquid, Film

   Ms. Juthamas Thongliamskun

   02-2181840

   Juthamas.Th@chula.ac.th

X-ray Diffractometer (XRD)

Application : To analyze crystal structure, chemical composition and physical properties of materials and thin films
Analysis Range : 5 to 90 degree
Description : Wide Angle, Small Angle
Type of sample : Sheet, Powder, Film

   Ms. Sutee Kaewsangiem

   02-2184126

   Sutee.K@chula.ac.th

Brand / Model : Rigaku, SmartLab

Brand / Model : Kratos / Axis ultra DLD

X-ray Photoelectron Spectroropy (XPS)

Application : To analyses the average surface chemistry of a sample up to a depth of approximately 10 nm. This technique quantitatively measures the elemental composition, atomic concentrations and chemical states of elements present at a samples surface
Analysis Range : –
Description : Wide scan ,Narrow scan ,Depth profile analysis,Catalysts Cell
Type of sample : inorganic compounds, metal alloys, semiconductors,polymers, elements, catalysts, glasses, ceramics, paints, papers, inks, woods, plant parts, make-up, teeth, bones, medical implants, bio-materials, coatings, viscous oils, glues, ion-modified materials and many others

   Ms. Chanokporn Sae-ung

   02-2181839

   Chanokporn.S@chula.ac.th